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Definition of "AFM" |
Atomic force microscopy or scanning force microscopy is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. / The minimum voltage required to create an arc between electrodes separated by a gas or liquid insulation under specified conditions. / See atomic force microscope. |
Definition of "AFM" |
Aircraft Flight Manual , |
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