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Definition of "Electron Beam Microprobe Analyzer" |
By combining high resolution electron optics and wavelength dispersive x-ray spectroscopy, electron beam microprobes provide highly sensitive, spatially resolved quantitative trace-element analysis. Having introduced the first electron beam microprobe to the market in 1960, followed by the development of many new equipment generations in the years since, JEOL can boast the most extensive experience worldwide in the x-ray microanalysis sector. |
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